AI data centers are the engines of the new data revolution, transforming data lakes and extracting meaningful insights guided by user queries. In this white paper, we revisit the security problem and ...

D imaging radar enhances automotive sensing by adding elevation to traditional range, velocity, and azimuth measurements. This enables better target detection and classification, enabling safer ...

Increasing complexity due to advanced packaging, multi-die assemblies, and more devices under test is having an impact on yield, which in turn slows time to market and impacts overall chip costs. What ...

A new technical paper, “Enabling Radiation Hardness in Solid-State NAND Storage Utilizing a Laminated Ferroelectric Stack,” was published by researchers at Georgia Tech. Abstract “NAND flash forms the ...

The case for sharing test, manufacturing, and design data.

Yield loss is increasingly driven by molecular variability in thin films, interfaces, and contamination rather than visible defects. Reliability issues often appear first as parametric drift or margin ...

A globally secure remote connectivity framework leveraging existing technologies (IPSec, VPN, TLS, SAML 2.0) through a ...

In today’s competitive semiconductor market, revenue growth is often associated with design innovation, process advancements, ...

Existing SpaceX Falcon9 rockets can carry about 17,500 kg into LEO, or about 12 Nvidia GB200 NVL72 racks worth of electronics ...

Researchers from Ulsan National Institute of Science and Technology (UNIST) designed a low power semiconductor circuit ...

With each device generation, the semiconductor content increases, leading to an increase in test complexity. This increase in test complexity is driving the need for more and more scan pattern memory.

OEMs are driving faster design cycles and enhanced security amid evolving vehicle architectures and compliance requirements.