Scan technology is essential for testing the digital content of large-volume devices. By using scan, you can make the device itself responsible for some of the “test” chores, and you can shorten the ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...

Efficient data compression and transmission are crucial in space missions due to restricted resources, such as bandwidth and storage capacity. This requires efficient data-compression methods that ...

With more and more embedded systems being connected, sending state information from one machine to another has become more common. However, sending large packets of data around on the network can be ...