SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
BEAVERTON, Ore., Sept. 16, 2021 /PRNewswire/ -- Tektronix, Inc., a leading worldwide provider of test and measurement solutions, today released KTE V7.1 software for the Keithley S530 Series ...
Targeting characterization of communications and high-speed digital devices at the wafer level, the Model S600DC/RF APT (automated parametric test) system from Keithley Instruments (Cleveland, OH, www ...
The reference or demodulated signal can be predetermined and stored as part of the test program. One method using EVM not only makes it possible to increase test coverage via system-level testing, but ...
Keysight’s 4881HV wafer test system enables parametric tests up to 3 kV, accommodating both high and low voltage in a single pass. Its high-voltage switching matrix facilitates this one-pass operation ...
Taking a swipe at the cost of ownership, two additions to the Pyramid parametric probe card family allow single-pass DC and RF measurements, promising to reduce the cost of parametric production test ...
Every day, new methods are being developed to harvest, cleanse, integrate, and analyze data sources and extract from them useful, actionable intelligence to aid decision-making and other processes.
To improve yield, quality, and cost, two separate test parameters can be combined to determine if a part passes or fails. The results gleaned from that approach are more accurate, allowing test and ...
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