With the aim of accelerating yield ramps of deep sub-micron semiconductors by speeding root cause analysis of defects to give better control over advanced processes, reduced time-to-market, and lower ...
Pipeline defect analysis and assessment remains a critical area of research, given its direct impact on the safety and reliability of energy transportation infrastructures. Mechanical defects such as ...
A new technical paper titled “Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging” was published by researchers at Arizona State University. “Fan-out ...
Scientists have developed an AI system that can rapidly predict complex defect patterns in liquid crystals, cutting simulation times from hours to milliseconds. The approach could transform how ...
The latest studies using CRAIC Technologies’ microspectroscopy have delivered important insights into the characterization of semiconductors and other new materials. The advanced abilities of CRAIC ...
Venice, Florida — SoftJin, introduced NxDAT, a tool for the analysis of defects identified by mask inspection systems. The software includes features for defect navigation, visual display, defect ...
The Atomic Force Microscope (AFM) has evolved from an extremely high resolution scientific research instrument into a highly accurate metrology tool. This evolution has broadened the role of the AFM ...
According to news reports, Samsung and TSMC are expected to enter 5nm process mass production in 2020. The competition in 5nm wafer yield and market share will be very intense. A brand new wafer ...
Across the physical world, many intricate structures form via symmetry breaking. When a system with inherent symmetry ...
In electroplating contaminations, residues or inclusions in the product can quickly lead to a marked product quality reduction or even to failure of full batches. Similar contaminations & defects of ...
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