Following its acquisition of Candela Instruments, KLA-Tencor (www.kla-tencor.com) has introduced the Candela CS20, an automated wafer inspection system designed to address the defect management ...
Semiconductor circuits (patterns) printed on semiconductor wafers (substrates) are shrinking, while such substrates are becoming larger in physical size. Over the years, the inspection of patterned ...
Some industry sectors such as automotive and medical continue to push for higher and higher reliability levels; however, many fabs are having difficulties achieving them. Current inspection regimes ...
Wafers produced for products as diverse as LEDs and MP3 players vary greatly in function, but they have one thing in common: They often undergo optical inspection after they pass an electrical test.
What is the Market Size of Wafer Defect Inspection System? BANGALORE, India, Dec. 16, 2025 /PRNewswire/ -- In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth ...
HSINCHU, Taiwan, Nov. 14, 2018 /PRNewswire/ -- MPI Corporation introduces a new 300 mm fully-automatic TS3500 wafer probe systems series with WaferWallet™. Over the past decade, the semiconductor ...
As IC devices get smaller and smaller, the challenge of detecting faults becomes bigger and bigger. Tamar Technology designs and manufactures application-specific automated visual inspection and metro ...
LONDON--(BUSINESS WIRE)--The semiconductor wafer inspection equipment market size is expected to grow by USD 1.71 billion, during 2020-2024, according to the latest market research report by Technavio ...
WILMINGTON, Mass.--(BUSINESS WIRE)--Onto Innovation Inc. (NYSE: ONTO) (“Onto Innovation,” “Onto,” or the “Company”) today announced its first shipment of the Company’s Dragonfly ® G3 system with the ...
3D optical profiling provides many benefits over other measurement methods used for non-contact inspection of semiconductor packaging front-end process research and control. These benefits range from ...
Wafers can be inspected for large, obvious defects, or for small, subtle ones. The former is referred to as macro-inspection, while the latter is micro-inspection. These processes use different ...
KLA-Tencor Corp. hopes to open a new market for wafer backside inspection with the introduction of an automated wafer backside inspection module today for its Surfscan 300mm-defect inspection tool.
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